Kalrez®
O-ring Seal News Releases #2
September 2005 - June 2004
Problem
Solving Products, Inc. solves sealing problems for original
equipment manufacturers. Call (303) 758-2728 for instant help
with any problem with an o-ring seal.
Article
6 7/6/2006
DuPont Performance Elastomers Spearheads Semicon Successes With
Kalrez® Seals At Semicon West 2006, DuPont Performance
Elastomers will focus on its range of Kalrez® perfluoroelastomer
parts for reduced particle adders and improved equipment reliability
in Etch and CVD processes.
Article
5 5/12/2006
Extended Role In Critical Chemical Process Sealing For Kalrez®
And Viton® With its line-up of Viton® fluoroelastomers
(FKM) and Kalrez® perfluoroelastomer (FFKM) parts, DuPont
Performance Elastomers (DPE) offered an o-ring seal or sealing
product for virtually every critical chemical process at Achema
'06.
Article
4 3/27/2006
DuPont Performance Elastomers Spearheads Semicon Successes With
Kalrez® Sahara™ 8085 And Bonded Door Seals At Semicon
Europa 2006 the focus was on Kalrez® Sahara™ 8085 for
reduced particle adders and improved equipment reliability in
CVD processes, and Kalrez® Bonded Door Seals for CVD, etch
and ashing in 200mm and 300mm wafer production equipment platforms.
Article
3 3/27/2006
DuPont Performance Elastomers Provices A To Z Of Critical CPI
Sealing With Viton® And Kalrez® Total chemical process
industry (CPI) o-ring seal performance will be the keynote of
DuPont Performance Elastomers ACHEMA 2006 line-up of Viton®
fluoroelastomers (FKM) and Kalrez® perfluoroelastomer (FFKM)
parts.
Article
2 9/1/2005
Kalrez® Spectrum™ 6375 O-Rings Solve Difficult Sealing
Problem In Natural Gas Sampling System Since switching to
Kalrez® in December 2002, A+ Corporation of Gonzales, Louisiana
reports that the o-ring seal in its GENIE® Probe Regulator™
(GPRTM) continues its record of flawless performance.
Article
1 6/30/2004
Kalrez® Sahara™ 8085 Offers Significantly Reduced Particle
Generation For Semiconductor Manufacturers Kalrez® Sahara™
8085 significantly reduced particle generation and improved equipment
reliability in both HDPCVD and tungsten CVD processes. The test
results will be available at Semicon West in San Francisco, July
12 to 14.
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